Jump to Navigation

Nano Characterization Workshop 2017

 At Nano Manufacturing Technology Centre

 Central Manufacturing Technology Institute

 Tumkur Road, Bengaluru

Friday, September 15, 2017

 

Industries, Academic and R&D Institutions are finding a dearth of characterization facilities in the country. CMTI, under the nano manufacturing program has established state of the art Nano Metrology and characterization facilities. This includes high resolution SEM, TEM AFM, Nanoindenter, Optical Profiler, Raman, XRD etc. To create awareness and provide exposure to these facilities, one day workshop on Nano Metrology & Materials Characterization is arranged. This workshop provides a comprehensive and condensed overview of techniques of nano metrology and major analytical techniques for materials characterization with emphasis on practical applications.


Topics include

  • Crystallographic & Spectroscopy (XRD, RAMAN & FTIR)
  • Optical Characterization (Optical Profiler, Ellipsometer & Confocal)
  • Electron & Scanning Probe Microscopy (SEM, TEM, AFM, STM, etc.,)
  • Mechanical Characterization ( Nano Indentation, Micro Hardness Testing)
  • Surface Area & Particle size analysis
  • Electrical characterization
  • X-Ray Inspection
  • Lab Tour


Presenters:

  • CMTI scientists and experts with hands-on experience in nano metrology and materials characterization.

 

Special event:

  • Demonstration of state of the art nano metrology and materials characterization equipments

 

Registration: Registration fee of Rs. 1534/- (including GST) per participant is chargeable which includes all lectures, lunch & refreshments and access to instrument demos

 

Last Date for Registration- 31st August 2017

 


Download Program Schedule



Download Flyer

 

 



by Dr. Radut.